X-ray metrology, a nondestructive characterization technique, was used to evaluate the warpage induced in a silicon (Si) wafer on a substrate with a predefined warpage. Section topography (ST) images ...

This paper presents the oceanographic objectives and plans for calibration and validation, science investigations and applications for the Surface Water and Ocean Topography (SWOT) Mission. SWOT, an ...

Using a Fourier analysis of the corneal topography data, regular astigmatism, asymmetry component and higher-order irregularity component were calculated in the central 3 mm zone. Quantitative ...

Topography is a key factor that governs important properties of surfaces, such as adhesion and wettability, and materials with switchable surface topographies will have switchable surface properties.